Direct imaging of electron recombination and transport on a semiconductor surface by femtosecond time-resolved photoemission electron microscopy
Sorry, this entry is only available in Japanese. For the sake of viewer convenience, the content is shown below in the alternative language. You may click the link to switch the active language.
Authors K. Fukumoto, Y. Yamada, K. Onda and S. Koshihara
Journal Applied Physics Letters. Vol.104.Issue 5. Page 053117 Date 2014, February Style Paper
DOI 10.1063/1.4864279