Direct imaging of electron recombination and transport on a semiconductor surface by femtosecond time-resolved photoemission electron microscopy

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Authors K. Fukumoto, Y. Yamada, K. Onda and S. Koshihara

Journal Applied Physics Letters. Vol.104.Issue 5. Page 053117  Date 2014, February  Style Paper
DOI 10.1063/1.4864279